Laser particle size analyzer

YXW-2000 wet benchtop laser particle size analyzer

YXW-2000 wet benchtop laser particle size analyzer

This wet benchtop laser particle size analyzer is developed by adopting the most advanced converging Fourier conversion light path, MIE, high stability He-Ne La
DESCRIPTION

This wet benchtop laser particle size analyzer is developed by adopting the most advanced converging Fourier conversion light path, MIE, high stability He-Ne Laser and high sensitivity ring photoelectric detector, the accuracy and repeatability are efficiently improved greatly. Built-in cycling wet dispersing system avoid the sedimentation of large particle. Strong data-handling capacity and original unconstrained fitting protect true result. This instrument is specialized by the advantages and repeatability.

YXW-2000 Wet Benchtop Laser Particle Size Analyzer

Technical Parameters:

Model 2000B 2000E 2000L 2000M 2000S
Testing Range 0.1-40µm / 0.6-120µm / 1-300µm 0.1-300µm 0.1-40µm / 0.6-120µm 0.1-40µm / 1-300µm 0.1-300µm
Number of Channel 32×3 40 32×3 32×3 70
Application Fields Anynano, semi-nano solid particle and emulsion For aluminum Alumina, carborundum etc. For cement
Feature Accuracy: < 1%; Repeatability: < 1%
Laser: He-Ne; λ=632.8nm; p > 2mw; > 20000h
Dispersing Way: Ultrasonic Dispersion / Mechanical Rabbling
Testing Speed: < 2min/time
Operation Model: Semi-automatic

Main Performance and Characteristics:

By adopting the most advanced converging Fourier conversion light path, the restriction of lens aperture to scattering angle was overcome and the analyzing accuracy for sub-micron particles is efficiently improved. This instrument is specialized by the advantages and repeatability.

Strong Generality: These series products have multi-file model and sole-file model. Reasonable product design with wonderful testing result for any kinds of particle can meet every enterprise requirement.

Built-in cycling wet dispersing system: Ultrasonic dispersion, Mechanical Rabbling and cycling pipeline are all build into the instrument, so the nonuniform distribution and sediment of particle are overcomed.

Unconstrained fitting: Original unconstrained fitting technology can protect user to get a more true distributor situation. This is very important for users from university and research center.